last modified 9/11/2005

Module code: MS4021
Module name: Structure Characterization
This concerns a Module
In the program of MSc Materials Science and Engineering
EC (European Credits): 5 (1 EC concerns a work load of 28 hours)
Faculty of Mechanical, Maritime and Materials Engineering
Department of Materials Science and Engineering
Lecturer 1: Dr. Ir. W.G. Sloof	Tel.:
Lecturer 2: Prof. Dr. H W Zandbergen
Catalog data:	Course year:	MSc 1^st year
	Course language:	English
	Semester:	1a 1b
	Hours per week:	4 lectures, practicals in 1b
	Other hours:	self study
	Assessment:
	Assessment period:	1b
	(see academic calendar)
Prerequisites (Module codes):
Follow up (Module codes):
Detailed description of topics: Microstructure characterization of materials through interaction between x-ray photons, electrons and ion beams and solids. Emission of element characteristic x-ray radiation. Auger electrons and photoelectrons. Phenomena such as: absorption, elastic and inelastic scattering. Sputtering with ions and depth profiling. Concepts such as depth, spectral and lateral resolution and detection limits. Various analytical techniques and their applications: electron microscopy, x-ray microanalysis, Auger electron spectroscopy, photoelectron spectroscopy, ion scattering spectroscopy, mass spectrometry and Rutherford backscattering spectroscopy. X-ray and electron diffraction to determine the crystallographic structure and lattice defects of materials. Laue equations and Bragg’s Law. Real and recipical space. Structure factor. Wave propagation of electrons. Methods to determine microstructure and chemical composition of materials from diffraction data and emission spectra.
Course material: Extensive lecture notes are available on Blackboard.
References from literature: Microstructural characterization of materials, D. Brandon W. D. Kaplan ISBN 0 471 98502 3.
Remarks assessment, entry requirements, etc.: Two parts written exam (you may use your book during the exam). Mean of the marks for both parts; lab-classes reporting should be sufficient.
Learning goals: - knowledge of physical principles of materials analysis techniques: diffraction and X-ray, electron and ion spectroscopy. - knowledge of physical principles of electron microscopy. - Knowledge of methods to determine quantitatively the chemical composition and microstructure of materials. - Capable to determine chemical composition and microstructure from diffraction and spectroscopical data. - Capable to select analysis techniques appropriate for specific applications.
Computer use: operation of surface analysis instruments and data acquisition and processing
Laboratory project(s): lab-classes (1 ECTS)
Design content: